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Integrated MEMs Test Solutions |
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Many MEMS test applications require testing at multiple temperatures, while high-volume applications usually require automated material handling as well. Achieving reliable and accurate calibration of MEMS devices AND reliability of the overall system involves careful selection, design, and integration of each sub-system component, including the ATE platform, mechanical stimulus, electro-mechanical test fixture, thermal conditioning equipment, and automation. A “top down” systems approach is the best path to ensuring that all system cost and performance objectives are realized. Using the MPX-2 as the ATE foundation, FocusTest can deliver turnkey MEMS test solutions ranging from low/medium volume semi-automated to high volume fully automated test systems. Low/Medium Volume Test FocusTest has developed a unique multi-site fixture/carrier technology that efficiently incorporates electrical contact, thermal conditioning, and coupling of the MEMS mechanical stimulus - fully utilizing the parallel test capability of the MPX-2 ATE system. The fixture is coupled with the MEMS specific stimulus source (shaker, rate table, pressure controller, etc.) and a thermal forcing unit to create a complete high performance turnkey test system.
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