Automated Material Handling Control Each FocusTest ATE turnkey system can be configured for interface with standard or custom IC handlers. For custom automation solutions, a Material Handler Protocol Specification (MHS Protocol) is available, along with a simulator that can be used by the automation vendor as an integration aid. The protocol is specifically designed for multi-site testing applications and greatly eases the task of ATE/Handler integration for custom automation applications. Reporting Database and Analysis tools Achieving high throughput rates for devices, such as automobile sensors, typically demands a parallel test scheme. However, the large amount of data generated with a multi-site system places heavy demands on the data storage and analysis operations required during initial device characterization, as well as normal production testing. The MPX-2 ATE software is designed to facilitate this time consuming task through the system’s integrated data-logging, database, and post-processing tools. Automated data extraction and reporting is performed using Microsoft Excel with embedded macros. Either you or FocusTest can create standard reporting formats, such as STDF, from the information in the SQL server database.

In addition to the MPX-2, FocusTest can deliver turnkey MEMS and non-MEMS test solutions including:
• Integrated MEMS Test Solutions Turnkey systems for testing at multiple temperatures and high volume material handling. • Accelerometer Test Systems Developed specifically for devices requiring vibration or constant G-level excitation. • Gyro Test Systems Complete system tests devices using constant velocity or sinusoidal angular rate input. • Pressure Sensor Test Systems For tests that require sampling of the DUT output over multiple pressures and temperatures. • Electro-mechanical Test Fixtures Custom built by FocusTest, our fixtures address a wide range of devices and testing requirements.

The MPX-2
High Performance, High Throughput
Device Testing

Ideal for a wide range of applications including manual operation, automated operation, testing at ambient or over a range of temperatures, the FocusTest MPX-2 ATE system is completely integrated with other system software and hardware components for ease-of-use and significantly increased system uptime.

The base MPX-2 is available in a single 5-slot group “8 DUT Channel” model and is scalable up to a “32 DUT Channel” configurations and beyond. Additional benefits include:

Flexible Instrument Platform
Unlike many conventional IC testers, the MPX-2 features an open instrument platform, enabling the user to apply resources optimally and economically based on test requirements.

In addition to the standard MPX-2 instrumentation, you can create your own instruments or easily integrate third-party PXI, GPIB, or LXI instrumentation. A unique testhead and loadboard design provides built-in signal paths, simplifying interface to the DUT, and eliminating extraneous cabling.

The end result is a more reliable system that can be rapidly adapted to evolving test requirements.

Modular Software System
The system’s device test application software program is distinct from other system software and enables you to change the testing environment without extensive rewriting of your existing applications. The system’s modular software system helps you leverage investments made in any previously created software, minimizing test result correlation issues when changing test environments. In short, you’ll save time and money and you’ll improve the consistency of your tests.

Easy to Use Operator Environment
The MPX-2’s user-friendly Operator Runtime Environment allows those with limited technical expertise to easily monitor the test production process (yield, test results, etc.).

The MPX-2 High Performance, High Throughput Device Testing

For more information: call 781-944-3891 or send email to info@focustestinc.com

The MPX-2
High Performance, High Throughput
Device Testing

For more information:
call 781-944-3891
or send email to info@focustestinc.com