Integrated ATE Systems for MEMs & Device Testing Applications

Smartly designed and built from the ground up, FocusTest ATE (Automated Testing Equipment) systems deliver the higher throughput and ease-of-use today’s device testing applications demand.

Today’s MEMS and device manufacturers face rigorous challenges:

Sophisticated devices require multiple testing environments and complex instrumentation.
Testing equipment must be upgraded to accommodate rapid changes in device design and new product lines.
Relentless pressures to reduce costs are coupled with demands for higher throughputs and ROI.

In addition, FocusTest systems are easily redeployed at any level of staging for wafer, strip test, and package device production processes – leveraging your engineering investment while lowering costs. Additional benefits include:

High throughput – Parallel architecture allows multiple devices to be tested simultaneously, delivering a significant increase in throughput, especially for devices with long test times.
Scalable platform – Flexible system architecture covers the full range of test requirements from manual low volume testing to fully automated high volume testing.
Open architecture – Common hardware and software architecture reduces or eliminates costly system upgrades and reconfigurations.
Small footprint – Elegantly designed system fits in small places, is easily moved to new stations.
Increased ROI – Simplified, integrated design reduces testing, manufacturing, and maintenance costs while supporting a full range of testing requirements.